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KLA Tencor P-2 (P2) Automated Long Scan Profiler Profilometer w/Options

$ 6335.99

Availability: 100 in stock
  • All returns accepted: ReturnsNotAccepted
  • Condition: This unit came right out from service. I have tested the unit to home the stage and make sure it rotated and tilted and that the stylus came down. I do not have anyway to test it after that.
  • Model: P-2
  • Brand: Tencor
  • Equipment Type: Profilometer
  • MPN: 148679

    Description

    KLA Tencor P-2 Automated Long Scan Profiler with Options
    Comes with a manual and what you see in the pictures. If you don't see it, you probably wont get it.
    Specifications are from KLA-Tencor and may vary slightly due to upgrades, options, or revisions this unit may or may not have.
    This unit came right out from service. I have tested the unit to home the stage and make sure it rotated and tilted and that the stylus came down. I do not have anyway to test it after that.
    The Unit's Serial Number Tag Reads:
    Model Number:
    148679
    Serial Number:
    03930242
    Description:
    P-2
    Power Requirements:
    115 V, 4 A, Single Phase, 60 Hz
    The Stylus's Serial Number Tag Reads:
    Model Number:
    222054
    Serial Number:
    03930249
    Optic:
    150-600X HI
    Stylus Force:
    0=:
    226
    10=:
    339
    40=:
    557
    100=:
    840
    300 µRange:
    0.9975
    Scan Length:
    0.0000000
    Backlash:
    0
    Drop Timer:
    27
    Linearity:
    A=:
    975
    B=:
    -350
    Options:
    Sequence / Data Base Manager Option
    Motorized Level and Rotation Option
    Description:
    The Tencor P-2 Long Scan Profiler is a computerized, high-sensitivity surface profiler that measures roughness, waviness, and step height in a variety of applications. It features the ability to measure micro-roughness with a 1 Å resolution over short distances as well as a waviness over a full, 210-mm (8.2-in) scan. The built-in PC/AT computing power offers precise, automatic measurement capability, data storage, and data analysis.
    The Tencor P-2 can profile a variety of materials, including:
    Magnetic disks
    Semiconductor wafers
    Precision-machined and polished surfaces
    Ceramics for micro-electronics
    Glass for flat panel displays
    Optical surfaces
    Features:
    Measurement of vertical features ranging from under 100 Å (0.4 µin) to approximately 0.3 mm (11 mils), with a vertical resolution of 1 or 25 Å (0.004 or 0.1 µin). Measurements can be taken in either metric or English units, which are selectable independently for horizontal and vertical parameters.
    Up to 5000 data points per profile guarantee that the horizontal resolution is generally limited by the stylus radius and not by the number of data points.
    Measurement of many roughness and waviness parameters with roughness and waviness separated by user-selectable cutoff filters. A band pass filter allows the separation of intermediate wavelengths.
    Ability to fit and level data, allowing accurate measurements on curved surfaces.
    Ability to detect the edge or apex of a profile artifact, allowing precise comparison of data measured on similar samples.
    Ability to segment a length into multiple scans as in the OD-to-OD profile of a disk with a center hole.
    Ability to repeat a scan up to ten times and automatically calculate the average, thereby minimizing the effects of environmental noise on measurements.
    Ability to execute a sequence of up to 300 scans automatically with the Sequence Option.
    Automatic positioning on the sample surface to within a few microns in X, Y, or rotation (motorized rotation is an optional feature).
    Precision mode, allowing precise location of small features and deskew coordinates for automatic operation.
    Built-in, 80386-based PC/AT controller with 40 MB of disk storage.
    Comprehensive database manager and the ability to export the data in a form that is compatible with Lotus 1-2-3 and other commercial programs. (This option is available for the Automatic Long Scan Profiler only.)
    Many ease-of-use features, including programmable stylus force, trackball control of measurement cursors and stage position, color screens with pull-down menus and pop-up windows.
    Accommodation of samples up to 355 mm (14 in) wide, 57.2 mm (2.25 in) thick, and 5 lb (2.2 kg) in weight with the normal configuration.
    Ability to limit operator access by means of a keylock (I do not have the key).
    Sequence/Database Manager Option:
    The Sequence/Database Manager Option consists of the Sequence and Database Manager software. This option included in the Automatic Long Scan Profiler. The option provides the following:
    Sequence software that enables a user to combine up to 300 recipes and artifact locations into a sequence. The complete sequence can then be run with or without operator intervention.
    Database Manager software that enables data to be saved with up to seven identifiers and later manipulated using the identifiers and time brackets.
    0.00 minimum for packaging, handling, and order processing. Shipping to be determined by destination.
    Prior to shipment I will need to know the following information (filled out on a form that I will send you) for International Customers or Packages/Freight being Forwarded internationally. International customers may also be subject to a freight forwarder form if applicable.:
    (1) Are you the end-user of this item?
    (2) If you are not the ultimate end-user of the item, please state the ultimate end user's name.
    (3) What is the ultimate country destination?
    10/17/12