SEMILAB Sopra GES-5E 8" Wafer XYZ Auto Mapping System, Ellipsometer, NICE!

Description

SEMILAB /Sopra GES-5E spectroscopic ellipsometer, Model XYZ 8” (190-900nm) is a fully automated measurement tool which measures the optical properties of thin film semiconductor materials, specifically the complex refractive index or dielectric function. Additionally, the
GES-5E
has mapping functionality and the incidence angle can be varied (typically, measurements are made from 60 to 85°). This tool is commonly used for analyzing film thicknesses and optical properties of single layer films, but it can also be used to measure the properties of more complex structures such as multi-layers, interface roughness or inhomogeneous layers.
APPLICATIONS:
Photovoltaic industry: crystalline silicon battery anti-reflection film, thin film battery transparent conductive film, amorphous silicon microcrystalline silicon thin film battery, CIGS thin film battery, CdTe thin film battery, organic battery, dye-sensitive solar cell
Semiconductor industry: High-K, Low-K, metal, photolithography process, semiconductor coating process, epitaxy process
Flat panel display industry: TFT, OLED, LTPS, IGZO, color filters
Optoelectronics industry: optical waveguides, anti-reflection films, III-V devices, MEMS, sol-gel
SALE Included
: (See All Photos)
SEMILAB /Sopra GES-5E Ellipsometer with an Aluminum Rolling Cart
1 unit. GES-5E X-Y-Z Mapping Stage,
Laser & Detector Installed
1 unit.
8 inch Measuring Sample Stage Unit
Tool Box contains of; (1 ea) Reference Sample(2,000nm), (1 ea) Reference Sample(T=122.16nm).
Assorted Sampling Tools
System Control PC (hard drive removed)
Operating Manual, Hard Copy
Manufactured in August 2010
PAYMENT & SHIPPING:
Payment for the item is due within 3 days of the auctions ending date.
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